A range of cards for the high speed execution and monitoring of digital test patterns in parallel. The deep memory option makes it a perfect solution for the most demanding of test applications. Features include:
Up to 32 channels per card.
Up to 8GB of memory.
Auto comparison of capture data to expected data; errors logged.
Loop and subroutines embedded in vector memory.
Clock rates of up to 50MHz.
3.3v operation or with optional pin driver 0-5v.
Optional programmable power supplies:
0-5v @ 24A (x1)
0-5v @ 12A (x3)
For more details on this product please contact us.